The Hosokawa Micron Parshe Analyzer is a Flow Particle Image Analyzer designed to measure particle size and shape of particles by means of analyzing images. The system produces precise, clear images leading to advanced measurement of particle shape, since all of the particles are in focus because of their passing through a Sheath-Flow cell. The Automatic focus-adjustment system corrects the fine deviation that can affect measurement values. As a result, no adjustment skill is required to obtain clear particle images. In addition, the internal lens is automatically selected by software depending on particle sizes. Additionally, an OPTIONAL Auto Sampler (PAS-AS) disperses the particles prior to starting a measurement acts as a pretreatment condition when measuring several samples. Resulting in no analysis measurement value differences between operators.
Fig.2 Measurement Systems Images
The "Combination Optical / Flow Control / Electrical / Image Analysis Technology"
The system supplies particles consistently to Sheath-Flow cell. They are focused by a camera since the sample is directed to a certain focal position by “sandwiching” the flow of Sheath liquid. The Sheath-Flow cell is placed between a Xenon lamp and a camera. The camera takes particle images illuminated by a Xenon lamp to make shadow pictures; it produces sharp particle outlines that are precisely captured (Fig. 2).
The automatic focus-adjustment system corrects the fine deviation which would affect the measurement values so clear particle images are acquired.
The Parshe Analyzer is "One of the best Flow Particle Image Analyzers for fine particles"
Fig.3 Particle images sandwiched
in Sheath liquid and LED illuminated for measurement
Fig.4 Polystyrene latex images
Parshe Analyzer / Auto Sampler
Fig.5 Particle images after binarization
Capable of storing both Particle Size Distribution and Particle Shape data simultaneously. (Fig. 5 Toner or Abrasive etc...)
Fig.6 Analysis results (using x20 Internal Lens)
- Able to save various data values, such as Particle Size, Shape and Shape Index based on the total number of analyzed particles from saved images. (Fig. 6)
Abrasive powders for manufacturing of semiconductor, cathode material for Lithium ion batteries.
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